Switching Characteristics
(Unless otherwise specified, Ta = -40 to 100°C,VCC = 4.5 to 20 V)
CHARACTERISTIC
SYMBOL
TEST
CIRCUIT
CONDITION
MIN
Propagation Delay Time
tpLH
to Logic High output
IF = 0→3 mA
30
Propagation Delay Time
to Logic Low output
tpHL
IF = 3→0 mA
30
7, 8
Switching Time Dispersion
between ON and OFF
|tpHL−tpLH|
―
―
Rise Time (10 – 90 %)
Fall Time (90 – 10 %)
Common Mode transient
Immunity at High Level Output
Common Mode transient
Immunity at Low Level Output
tr
tf
CMH
CML
IF = 0→3 mA , VCC = 5 V
―
IF = 3→0 mA , VCC =5 V
―
VCM = 1000 Vp-p, IF = 5 mA,
-10000
VCC =20 V, Ta = 25 °C
9
VCM = 1000 Vp-p, IF = 0 mA, 10000
VCC = 20 V, Ta = 25° C
*All typical values are at Ta = 25 °C
TYP.
150
150
―
30
30
―
―
TLP105
MAX UNIT
250
ns
250
ns
220
ns
75
ns
75
ns
―
V/μs
―
V/μs
Test Circuit 1: VOL
1
6
VCC
5
0.1µF
3
GND 4
VOL IOL
V↑
VCC
SHIELD
Test Circuit 2: VOH
IF→ 1
6
VCC
5
↑
3
GND 4
SHIELD
VOH IOH
V↑
0.1µF
VCC
Test Circuit 3: ICCL
1
6
ICCL
VCC
A
5
VCC
0.1µF
3
GND 4
SHIELD
Test Circuit 4: ICCH
I→F 1
VCC
6
ICCH
A
↑
3
5
GND 4
SHIELD
0.1µF
VCC
Test Circuit 5: IOSL
1
6
VCC
5
0.1µF
A
3
GND 4
IOSL
VCC
SHIELD
VO
Test Circuit 6: IOSH
IF 1
→
6
VCC
5
↑
3
GND 4
SHIELD
0.1µF
A
IOSH
VO
VCC
© 2019
4
Toshiba Electronic Devices & Storage Corporation
2019-05-27