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MX29F800CB 데이터 시트보기 (PDF) - Integrated Device Technology
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MX29F800CB
8M-BIT [1024K x 8 / 512K x 16] SINGLE VOLTAGE 5V ONLY FLASH MEMORY
Integrated Device Technology
MX29F800CB Datasheet PDF : 48 Pages
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SWITCHING TEST CIRCUITS
Vcc
0.1uF
TESTED DEVICE
MX29F800C T/B
R2
Vcc
R1
CL
Test Condition
Output Load : 1 TTL gate
Output Load Capacitance,CL : 30PF for 70ns
Rise/Fall Times : 10ns
Input pulse levels: 0.45V/0.7xVcc
Reference levels for measuring timing :0.8V, 2.0V
DIODES=IN3064
OR EQUIVALENT
R1=6.2K ohm
R2=2.7K ohm
SWITCHING TEST WAVEFORMS
0.7xVCC
0.45V
INPUT
2.0V
0.8V
TEST POINTS
2.0V
0.8V
OUTPUT
P/N:PM1493
REV. 1.2, JUL. 05, 2012
17
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