M39432 데이터 시트보기 (PDF) - STMicroelectronics
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M39432 Datasheet PDF : 28 Pages
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M39432
Table 11. DC Characteristics
(TA = –40 to 85 °C; VCC = 2.7 V to 3.6 V)
Symbol
Parameter
Test Condition
Min.
Mean2
(Typ.)
Max. Unit
ILI Input Leakage Current
0 V ≤ VIN ≤ VCC
±1
µA
ILO Output Leakage Current
0 V ≤ VOUT ≤ VCC
±1
µA
ICC11 Supply Current (Read Flash) TTL
(EE,EF,G) = (VIH,VIL,VIH),
f = 6 MHz
3
15
mA
ICC2
Supply Current (Read EEPROM)
TTL
(EE,EF,G) = (VIL,VIH,VIH),
f = 6 MHz
3
15
mA
ICC3 Supply Current (Stand-by) CMOS
EF = EE = VCC ± 0.2 V
60
µA
ICC4
Supply Current (Flash block
Program or Erase)
Byte program, Sector or
Chip Erase in progress
3
20
mA
ICC5 Supply Current (EEPROM Write)
During tWC
3
20
mA
ICC6
Supply Current in Deep Power
Down Mode
After a Deep Power Down
instruction (see Table 4)
0.2
6
µA
VIL Input Low Voltage
–0.5
0.8
V
VIH Input High Voltage
2
VCC + 0.5 V
VOL Output Low Voltage
IOL = 1.8 mA
0.45
V
VOH Output High Voltage
IOH = –100 µA
VCC – 0.4
V
VID A9 High Voltage
11.5
12.5
V
IID
VID Current
A9 = VID
50
µA
VLKO
VCC minimum for Write, Erase and
Program
1.9
2.2
V
Note: 1. When reading the Flash block and an EEPROM write cycle is already underway, the supply current is ICC1 + ICC5.
2. Averaged (over time) typical value.
Table 12. AC Measurement Conditions
Input Rise and Fall Times
≤ 10 ns
Input Pulse Voltages
0.45 V to 2.4 V
Input Timing Reference Voltages
0.8 V and 2 V
Output Timing Reference Voltages
1.5 V
Figure 10. AC Testing Input Output Waveforms
2.4V
0.45V
1.5V
AI01950
Figure 11. Output AC Testing Load Circuit
VCC
Device
Under
Test
IOL
1N914
1N914
IOH
CL = 30pF
CL includes JIG capacitance
VOUT = 1.5V when the Device
Under Test is in the
Hi-Z output state.
AI01951C
15/28
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