DA28F016SA-070 데이터 시트보기 (PDF) - Intel

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DA28F016SA-070

16-MBIT (1 MBIT X 16, 2 MBIT X 8) FlashFile™ MEMORY

Intel 

28F016SA

E

2.4

2.0

INPUT

TEST POINTS

2.0

OUTPUT

0.8

0.8

0.45

AC test inputs are driven at VOH (2.4 VTTL) for a Logic “1” and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at VIH

(2.0 VTTL) and VIL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise and fall times (10% to 90%) <10 ns.

0489_06

Figure 7. Transient Input/Output Reference Waveform (VCC = 5.0V ± 10%)

for Standard Test Configuration(1)

3.0

INPUT

1.5

TEST POINTS

1.5 OUTPUT

0.0

0489_07

AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.

Input rise and fall times (10% to 90%) <10 ns.

Figure 8. Transient Input/Output Reference Waveform (VCC = 3.3V ± 10%)

High Speed Reference Waveform(2) (VCC = 5.0V ± 5%)

NOTES:

1. Testing characteristics for 28F016SA-080/28F016SA-100.

2. Testing characteristics for 28F016SA-070/28F016SA-120/28F016SA-150.

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