28F320S3 데이터 시트보기 (PDF) - Intel

부품명

상세내역

제조사

28F320S3

WORD-WIDE FlashFile™ MEMORY FAMILY

Intel 

E

28F160S3, 28F320S3

6.2.1

CAPACITANCE

Table 18. Capacitance(1), TA = +25°C, f = 1 MHz

Symbol

Parameter

Typ

Max

Unit

CIN

Input Capacitance

6

8

pF

COUT

Output Capacitance

NOTE:

1. Sampled, not 100% tested.

8

12

pF

6.2.2

AC INPUT/OUTPUT TEST CONDITIONS

Condition

VIN = 0.0V

VOUT = 0.0V

2.7

INPUT

1.35

0.0

TEST POINTS

1.35 OUTPUT

AC test inputs are driven at 2.7V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.35V.

Input rise and fall times (10% to 90%) <10 ns.

Figure 14. Transient Input/Output Reference Waveform for VCC = 2.7V–3.6V

3.0

INPUT

1.5

TEST POINTS

1.5 OUTPUT

0.0

AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.5V.

Input rise and fall times (10% to 90%) <10 ns.

Figure 15. Transient Input/Output Reference Waveform for VCC = 3.3V ± 0.3V

(High Speed Testing Configuration)

1.3V

1N914

DEVICE

UNDER

TEST

C L Includes Jig

Capacitance

R L = 3.3 kΩ

OUT

CL

Figure 16. Transient Equivalent Testing

Load Circuit

ADVANCE INFORMATION

Test Configuration Capacitance Loading Value

Test Configuration

CL (pF)

VCC = 3.3V ± 0.3V, 2.7V to 3.6V

50

41

Share Link: