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74HCT4052BQ(2017) 데이터 시트보기 (PDF) - NXP Semiconductors.

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74HCT4052BQ
(Rev.:2017)
NXP
NXP Semiconductors. NXP
74HCT4052BQ Datasheet PDF : 28 Pages
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Nexperia
74HC4052; 74HCT4052
Dual 4-channel analog multiplexer/demultiplexer
12 Additional dynamic characteristics
Table 12. Additional dynamic characteristics
Recommended conditions and typical values; GND = 0 V; Tamb = 25 °C; CL = 50 pF.
Vis is the input voltage at pins nYn or nZ, whichever is assigned as an input.
Vos is the output voltage at pins nYn or nZ, whichever is assigned as an output.
Symbol Parameter
Conditions
Min
dsin
sine-wave distortion
fi = 1 kHz; RL = 10 kΩ; see Figure 16
Vis = 4.0 V (p-p); VCC = 2.25 V; VEE = -2.25 V
-
Vis = 8.0 V (p-p); VCC = 4.5 V; VEE = -4.5 V
-
fi = 10 kHz; RL = 10 kΩ; see Figure 16
Vis = 4.0 V (p-p); VCC = 2.25 V; VEE = -2.25 V
-
Vis = 8.0 V (p-p); VCC = 4.5 V; VEE = -4.5 V
-
αiso
isolation (OFF-state)
RL = 600 Ω; fi = 1 MHz; see Figure 17
VCC = 2.25 V; VEE = -2.25 V
VCC = 4.5 V; VEE = -4.5 V
[1] -
[1] -
Xtalk crosstalk
between two switches/multiplexers; RL = 600 Ω;
fi = 1 MHz; see Figure 18
VCC = 2.25 V; VEE = -2.25 V
VCC = 4.5 V; VEE = -4.5 V
[1] -
[1] -
Vct
crosstalk voltage
peak-to-peak value; between control and any switch;
RL = 600 Ω; fi = 1 MHz; E or Sn square wave between
VCC and GND; tr = tf = 6 ns; see Figure 19
VCC = 4.5 V; VEE = 0 V
-
VCC = 4.5 V; VEE = -4.5 V
-
f(-3dB)
-3 dB frequency response RL = 50 Ω; see Figure 20
VCC = 2.25 V; VEE = -2.25 V
VCC = 4.5 V; VEE = -4.5 V
[2] -
[2] -
Typ
0.04
0.02
0.12
0.06
-50
-50
-60
-60
110
220
170
180
Max Unit
-%
-%
-%
-%
- dB
- dB
- dB
- dB
- mV
- mV
- MHz
- MHz
[1] Adjust input voltage Vis to 0 dBm level (0 dBm = 1 mW into 600 Ω).
[2] Adjust input voltage Vis to 0 dBm level at Vos for 1 MHz (0 dBm = 1 mW into 50 Ω).
VCC
Sn
Vis
10 µF nYn/nZ
nZ/nYn
Vos
VEE GND RL
CL dB
Figure 16.  Test circuit for measuring sine-wave distortion
001aah829
74HC_HCT4052
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 12 — 10 October 2017
© Nexperia B.V. 2017. All rights reserved.
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