74HCT4052BQ 데이터 시트보기 (PDF) - NXP Semiconductors.

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74HCT4052BQ

Dual 4-channel analog multiplexer/demultiplexer

NXP Semiconductors. 

NXP Semiconductors

74HC4052; 74HCT4052

Dual 4-channel analog multiplexer/demultiplexer

VCC

Sn

Vis

10 μF nYn/nZ

nZ/nYn

Vos

VEE GND RL

CL dB

Fig 16. Test circuit for measuring sine-wave distortion

001aah829

VCC

Sn

Vis

0.1 μF nYn/nZ

nZ/nYn

Vos

VEE GND RL

CL dB

VCC = 4.5 V; GND = 0 V; VEE = 4.5 V; RL = 600 ; RS = 1 k.

a. Test circuit

001aah871

0

αiso

(dB)

−20

001aae332

−40

−60

−80

−100

10

102

103

104

b. Isolation (OFF-state) as a function of frequency

Fig 17. Test circuit for measuring isolation (OFF-state)

105

106

fi (kHz)

74HC_HCT4052

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 10 — 19 July 2012

© NXP B.V. 2012. All rights reserved.

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