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MC33580BAPNA/R2 데이터 시트보기 (PDF) - Freescale Semiconductor

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MC33580BAPNA/R2
Freescale
Freescale Semiconductor Freescale
MC33580BAPNA/R2 Datasheet PDF : 38 Pages
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ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 4. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 6.0 V VPWR 27 V, 4.5 V VDD 5.5 V, - 40°C TA 125°C, GND = 0 V unless
otherwise noted. Typical values noted reflect the approximate parameter means at TA = 25°C under nominal conditions unless
otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
SPI INTERFACE CHARACTERISTICS
Maximum Frequency of SPI Operation
f SPI
Required Low State Duration for RST (26)
t WRST
Rising Edge of CS to Falling Edge of CS (Required Setup Time) (27)
t CS
Rising Edge of RST to Falling Edge of CS (Required Setup Time) (27)
t ENBL
Falling Edge of CS to Rising Edge of SCLK (Required Setup Time) (27)
t LEAD
Required High State Duration of SCLK (Required Setup Time) (27)
t WSCLKh
Required Low State Duration of SCLK (Required Setup Time) (27)
t WSCLKl
Falling Edge of SCLK to Rising Edge of CS (Required Setup Time) (27)
t LAG
SI to Falling Edge of SCLK (Required Setup Time) (28)
t SI (SU)
Falling Edge of SCLK to SI (Required Setup Time) (28)
t SI (HOLD)
SO Rise Time
CL = 200 pF
t RSO
SO Fall Time
CL = 200 pF
SI, CS, SCLK, Incoming Signal Rise Time (28)
SI, CS, SCLK, Incoming Signal Fall Time (28)
Time from Falling Edge of CS to SO Low Impedance (29)
Time from Rising Edge of CS to SO High Impedance (30)
Time from Rising Edge of SCLK to SO Data Valid (31)
0.2 VDD SO 0.8 VDD, CL = 200 pF
t FSO
t RSI
t FSI
t SO(EN)
t SO(DIS)
t VALID
3.0
MHz
50
350
ns
300
ns
5.0
µs
50
167
ns
167
ns
167
ns
50
167
ns
25
83
ns
25
83
ns
ns
25
50
ns
25
50
50
ns
50
ns
145
ns
65
145
ns
ns
65
105
Notes
26. RST low duration measured with outputs enabled and going to OFF or disabled condition.
27. Maximum setup time required for the 33580 is the minimum guaranteed time needed from the microcontroller.
28. Rise and Fall time of incoming SI, CS, and SCLK signals suggested for design consideration to prevent the occurrence of double pulsing.
29. Time required for output status data to be available for use at SO. 1.0 kon pullup on CS.
30. Time required for output status data to be terminated at SO. 1.0 kon pullup on CS.
31. Time required to obtain valid data out from SO following the rise of SCLK.
33580
12
Analog Integrated Circuit Device Data
Freescale Semiconductor

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