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MRF5S9100NBR1 데이터 시트보기 (PDF) - Freescale Semiconductor

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MRF5S9100NBR1 Datasheet PDF : 16 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Table 3. ESD Protection Characteristics
Test Conditions
Class
Human Body Model (per JESD22 - A114)
1C (Minimum)
Machine Model (per EIA/JESD22 - A115)
A (Minimum)
Charge Device Model (per JESD22 - C101)
IV (Minimum)
Table 4. Moisture Sensitivity Level
Test Methodology
Rating
Package Peak Temperature
Unit
Per JESD 22 - A113, IPC/JEDEC J - STD - 020
3
260
°C
Table 5. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(VDS = 68 Vdc, VGS = 0 Vdc)
IDSS
10
μAdc
Zero Gate Voltage Drain Leakage Current
(VDS = 26 Vdc, VGS = 0 Vdc)
IDSS
1
μAdc
Gate - Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
IGSS
1
μAdc
On Characteristics
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 400 μA)
VGS(th)
2
2.8
3.5
Vdc
Gate Quiescent Voltage
(VDS = 26 Vdc, ID = 950 mAdc)
VGS(Q)
3.7
Vdc
Drain - Source On - Voltage
(VGS = 10 Vdc, ID = 2.0 Adc)
VDS(on)
0.21
0.3
Vdc
Forward Transconductance
(VDS = 10 Vdc, ID = 6 Adc)
gfs
7
S
Dynamic Characteristics (1)
Output Capacitance
(VDS = 26 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Coss
70
pF
Reverse Transfer Capacitance
(VDS = 26 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Crss
2.2
pF
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 26 Vdc, IDQ = 950 mA, Pout = 20 W Avg. N - CDMA, f = 880 MHz,
Single - Carrier N - CDMA, 1.2288 MHz Channel Bandwidth Carrier. ACPR measured in 30 kHz Bandwidth @ ±750 kHz Offset. PAR = 9.8 dB
@ 0.01% Probability on CCDF
Power Gain
Gps
18
19.5
dB
Drain Efficiency
ηD
26
28
%
Adjacent Channel Power Ratio
ACPR
- 46.8
- 45
dBc
Input Return Loss
IRL
- 19
-9
dB
1. Part internally input matched.
MRF5S9100NR1 MRF5S9100NBR1
2
RF Device Data
Freescale Semiconductor

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