33291 데이터 시트보기 (PDF) - Freescale Semiconductor

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33291

Eight-Output Switch with Serial Peripheral Interface I/O

Freescale Semiconductor 

FUNCTIONAL DESCRIPTION

sometimes be determined over hard short faults and

overtemperature faults by observing the time required for the

device to recover. However, in general overcurrent and

overtemperature faults cannot be differentiated in normal

application usage.

An advantage of the synchronous serial output is multiple

faults can be detected with only one (SO) pin being used for

fault status reporting.

If VPWR experiences an overvoltage condition, all outputs

will immediately be turned OFF and remain latched OFF. A

new command word is required to turn the outputs back ON

following an overvoltage condition.

Output Voltage Clamping

Each output of the 33291 incorporates an internal voltage

clamp to provide fast turn-off and transient protection of the

output. Each clamp independently limits the drain-to-source

voltage to 53 V at drain currents of 0.5 A and keeps the

output transistors from avalanching by causing the transient

energy to be dissipated in the linear mode (see Figure 21).

The total energy clamped (EJ) can be calculated by

multiplying the current area under the current curve (IA) times

the clamp voltage (VCL) times the duration the clamp is active

(t).

Characterization of the output clamps, using a single pulse

non-repetitive method at 0.5 A, indicates the maximum

energy to be 50 mJ at 150°C junction temperature per output.

Drain-to-Source Clamp

Voltage (VCL = 65 V)

Drain Current

(ID = 0.5 A)

Drain Voltage

Clamp Energy

(EJ = IA x VCL x t)

Drain-to-Source ON

Voltage (VDS(ON))

GND

Current

Area (IA)

Figure 21. Output Voltage Clamping

VPWR

Time

THERMAL CHARACTERIZATION

THERMAL MODEL

Logic functions take up a very small area of the die and

generate negligible power. In contrast, the output transistors

take up most of the die area and are the primary contributors

of power generation. The thermal model illustrated in

Figure 22, page 22, was developed for the 33291 mounted

on a typical PC board. The model is accurate for both steady

state and transient thermal conditions. The components Rd0

through Rd7 represent the steady state thermal resistance of

Analog Integrated Circuit Device Data

Freescale Semiconductor

the silicon die for transistor outputs 0 through 7, while Cd0

through Cd7 represent the corresponding thermal

capacitance of the silicone die translator outputs and plastic.

The device area and die thickness determine the values of

these specific components.

The thermal impedance of the package from the internal

mounting flag to the outside environment is represented by

the terms RPKG and CPKG. The steady state thermal

resistance of leads and the PC board make up the steady

state package thermal resistance, Rpkg. The thermal

capacitance of the package is made up of the combined

capacitance of the flag and the PC board. The mode

compound was not modeled as a specific component but it is

factored into the other overall component values.

The battery voltage in the thermal model represents the

ambient temperature the device and PC board are subjected

to. The IPWR current source represents the total power

dissipation and is calculated by totalling the power dissipation

of each individual output transistor. This is easily

accomplished by knowing RDS(ON) and load current of the

individual outputs.

Very satisfactory steady state and transient results are

experienced with this thermal model. Tests indicate the

model accuracy to have less than 10 percent error. Output

interaction with an adjacent output is believed to be the main

contributor to the thermal inaccuracy. Tests indicate little or

no detectable thermal effects caused by distant output

transistors isolated by one or more other outputs. Tests were

conducted with the device mounted on a typical PC board

placed horizontally in a 33 cubic inch still air enclosure. The

PC board was made of FR4 material measuring 2.5 by

2.5 inches, having double-sided circuit traces of 1.0 ounce

copper soldered to each device pin. The board temperature

was measured with thermal couple soldered to the board

surface one inch away from the center of the device. The

ambient temperature of the enclosure was measured with a

second thermal couple located over the center of one inch

distance from device.

THERMAL PERFORMANCE

Figure 22 illustrates the worst case thermal component

parameters values for the 33291 in the 24-lead SOIC wide

body surface mount package. Pins 5, 6, 7, 8, 17, 18, 19, and

20 of the package were connected directly to the lead frame

flag. The parameter values indicated take into account

adjacent output combinations. The characterization was

conducted over power dissipation levels of 0.7 W to 17 W.

The junction-to-ambient temperature resistance was found to

be 40°C/W with a single output active (34°C/W with all

outputs dissipating equal power 0 and the thermal resistance

from junction-to-PC board (RJUNCTION-BOARD) to be 30°C/W

(board temperature, measure one inch from device center).

The junction-to-heatsink lead resistance was found again to

approximate 10°C/W. Devoting additional PC board metal

around the heatsinking pins for this package improved the

RPKG from 33° to 31°C/W.

33291

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