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74LVX16245 데이터 시트보기 (PDF) - STMicroelectronics

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74LVX16245 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
74LVX16245
CAPACITIVE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
CIN Input Capacitance
4 10
10
10 pF
CI/O
Output
Capacitance
8
pF
CPD Power Dissipation
Capacitance
21
pF
(note 1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/8 (per circuit)
DYNAMIC SWITCHING CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCC
(V)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
VOLP Dynamic Low
0.3 0.8
Voltage Quiet
3.3
V
VOLV Output (note 1, 2)
-0.8 -0.3
Dynamic High
VIHD Voltage Input
3.3
CL = 50 pF
2.0
V
(note 1, 3)
Dynamic Low
VILD Voltage Input
3.3
(note 1, 3)
0.8
V
1) Worst case package.
2) Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V, (n-1) outputs switching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.3V. Inputs under test switching: 3.3V to threshold (VILD), 0V to threshold
(VIHD), f=1MHz.
5/10

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