3150 데이터 시트보기 (PDF) - Allegro MicroSystems
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3150 Datasheet PDF : 12 Pages
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3150
PROGRAMMABLE, CHOPPER-
STABILIZED, PRECISION,
HALL-EFFECT SWITCH
CRITERIA FOR DEVICE QUALIFICATION
All Allegro sensors are subjected to stringent qualification requirements prior to being released to production.
To become qualified, except for the destructive ESD tests, no failures are permitted.
Qualification Test
Test Method and Test Conditions
Biased Humidity (HAST) TA = 130°C, RH = 85%
High-Temperature
Operating Life (HTOL)
Accelerated HTOL
JESD22-A108,
TA = 150°C, TJ = 165°C
JESD22-A108,
TA = 175°C, TJ = 190°C
Autoclave, Unbiased
JESD22-A102, Condition C,
TA = 121°C, 15 psig
High-Temperature
(Bake) Storage Life
Temperature Cycle
MIL-STD-883, Method 1008,
TA = 170°C
MIL-STD-883, Method 1010,
-65°C to +150°C
Latch-Up
—
Electro-Thermally
Induced Gate Leakage
ESD,
Human Body Model
Electrical Distributions
—
CDF-AEC-Q100-002
Per Specification
Test Length Samples
50 hrs
77
408 hrs
77
504 hrs
77
96 hrs
77
1000 hrs
77
500 cycles
77
Pre/Post
Reading
Pre/Post
Reading
Pre/Post
Reading
—
6
6
x per
test
30
Comments
VCC = VOUT = 5 V
VCC = 24 V,
VOUT = 20 V
VCC = 24 V,
VOUT = 20 V
Test to failure,
All leads > TBD
115 Northeast Cutoff, Box 15036
Worcester, Massachusetts 01615-0036 (508) 853-5000
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