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AM29LV081B-90EEB 데이터 시트보기 (PDF) - Advanced Micro Devices

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AM29LV081B-90EEB Datasheet PDF : 38 Pages
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REVISION SUMMARY
Revision B
Expanded data sheet from Advanced Information to
Preliminary version.
Distinctive Characteristics
Changed “Manufactured on 0.35 µm process technology”
to “Manufactured on 0.32 µm process technology”.
General Description
Second paragraph: Changed “This device is manufac-
tured using AMD’s 0.35 µm process technology” to
“This device is manufactured using AMD’s 0.32 µm
process technology”.
Revision C
Distinctive Characteristics
Added:
s 20-year data retention at 125°C
— Reliable operation for the life of the system
Ordering Information
Valid Combinations: Replaced Am29LV081B-100 with
Am29LV081B-90.
DC Characteristics—CMOS Compatible
ICC1, ICC2, ICC3, ICC4, ICC5: Added Note 2 “Maximum
ICC specifications are tested with VCC = VCCmax”.
Revision C+1
Global
In title of data sheet and in ordering information sec-
tion, changed “sector erase” to “uniform sector.”
Revision D (November 19, 1999)
AC Characteristics—Figure 15. Program
Operations Timing and Figure 16. Chip/Sector
Erase Operations
Deleted tGHWL and changed OE# waveform to start at
high.
Physical Dimensions
Replaced figures with more detailed illustrations.
Corrected “TSR048—48-Pin Reverse TSOP” to
“TSR040—40-Pin Reverse TSOP”.
Trademarks
Copyright © 2000 Advanced Micro Devices, Inc. All rights reserved.
AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.
ExpressFlash is a trademark of Advanced Micro Devices, Inc.
Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.
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Am29LV081B

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