AS29F040 데이터 시트보기 (PDF) - Alliance Semiconductor
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AS29F040 Datasheet PDF : 18 Pages
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Parameter
Sector erase and verify-1 time (excludes 00h programming prior to erase)
Byte program time
Chip programming time
Erase/program cycles
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Parameter
Input voltage with respect to VSS on A9 and OE
Input voltage with respect to VSS on all DQ, address and control pins
Current
Includes all pins except VCC. Test conditions: VCC = 5.0V, one pin at a time.
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Limits
Min
Typical
Max
Unit
-
1.0
-
sec
-
45
-
µs
-
23
-
sec
-
-
10,000 cycles
Min
Max
Unit
-1.0
+13.0 V
-1.0
VCC+1.0 V
-100
+100 mA
Device under Test
100 pF*
VSS
*including scope
and jig capacitance
Test condition
Output load
Input rise and fall times
Input pulse levels
Input timing measurement reference levels
Output timing measurement reference levels
Unit
1 TTL gate
5
ns
0.0-3.0
V
1.5
V
1.5
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Parameter
Symbol
Min
Max
Unit
Input voltage (Input or DQ pin)
VIN
–2.0
+7.0
V
Input voltage (A9 pin, OE)
VIN
–2.0
+13.0
V
Power supply voltage
VCC
-0.5
+5.5
V
Operating temperature
TOPR
–55
+125
°C
Storage temperature (plastic)
TSTG
–65
+125
°C
Short circuit output current
IOUT
-
200
mA
NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect reliability.
Includes all pins except VCC. Test conditions: VCC = 5.0V, one pin at a time.
49
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