H28405 데이터 시트보기 (PDF) - Harris Semiconductor

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H28405

600MHz, Very High Slew Rate Operational Amplifier

Harris Semiconductor 

HA-2840

Test Circuits and Waveforms (Continued)

V+ 0.001µF

INPUT

200Ω

-

1µF

+ 0.001µF

500Ω

SETTLING

POINT

V- 1µF

2kΩ

5kΩ

OUTPUT

PROBE

MONITOR

NOTES:

12. AV = -10.

13. Load Capacitance should be less than 10pF.

14. It is recommended that resistors be carbon composition

and that feedback and summing network ratios be

matched to 0.1%.

15. SETTLING POINT (Summing Node) capacitance should

be less than 10pF. For optimum settling time results, it is

recommended that the test circuit be constructed directly

onto the device pins. A Tektronix 568 Sampling

Oscilloscope with S-3A sampling heads is recommend-

ed as a settle point monitor.

SETTLING TIME TEST CIRCUIT

Typical Performance Curves TA = 25oC, VSUPPLY = ±15V, RL = 1kΩ, CL < 10pF, Unless Otherwise Specified

100

80

60

40

20

0

AVCL = 1000

OPEN LOOP

AVCL = 100 AVCL = 10

0

90

OPEN LOOP

180

1K

10K

100K

1M

10M 100M

FREQUENCY (Hz)

FIGURE 1. FREQUENCY RESPONSE FOR VARIOUS GAINS

650

600

550

500

5 6 7 8 9 10 11 12 13 14 15

SUPPLY VOLTAGE (±V)

FIGURE 2. GAIN BANDWIDTH PRODUCT vs SUPPLY VOLTAGE

750

650

550

450

350

250

-60 -40 -20

0 20 40 60 80

TEMPERATURE (oC)

100 120 140

FIGURE 3. GAIN BANDWIDTH PRODUCT vs TEMPERATURE

90

80

70

60

50

40

30

20

100

1K

10K

100K

1M

10M

FREQUENCY (Hz)

FIGURE 4. CMRR vs FREQUENCY

4

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