HA-2529/883 데이터 시트보기 (PDF) - Intersil
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HA-2529/883 Datasheet PDF : 9 Pages
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Test Circuit (Applies to Tables 1 and 2)
HA-2529/883
667
1.33K
ACOUT
V+
50pF
- 1/10
(NOTE)
V1
0.1 1
100K
1 OPEN
2 S3A
S1 1
OPEN 2
S2 1
OPEN 2
100K 2 S3B
2
1 S5A
1 S6
2
OPEN
S7
1
3
2
NOTE: Includes stray
capacitances
-
DUT
+
2
S5B 1
OPEN 1
500K
S8
2
3
OPEN
1
S9
2
V2
50K
For loop stability, use min value
capacitor to prevent oscillation
-
+
-
-1
+
BUFFER
1
100
100
OPEN
VAC
0.1 1
50
V-
5K
2 S4
2K
10K
EOUT
x2
1
50K
ALL RESISTORS = ±1% (Ω)
ALL CAPACITORS = ±10% (µF)
Test Circuits and Waveforms
+1.67V
INPUT
-1.67V
+5V
90%
OUTPUT 10%
-5V
∆t
∆V
SLEW
RATE
= ∆V/∆t
ERROR BAND
±10mV FROM
FINAL VALUE
SETTLING
TIME
FIGURE 1. SLEW RATE AND SETTLING TIME
67mV
INPUT
0mV
+200mV
90%
OUTPUT
10%
0V
OVERSHOOT
RISE TIME
0
-67mV
NOTE: Measured on both positive and negative transitions from 0V
to +200mV and 0V to -200mV at the output.
FIGURE 2. TRANSIENT RESPONSE
VIN
50Ω
+-
1.33kΩ
667Ω
VOUT
50pF
FIGURE 3. SIMPLIFIED TEST CIRCUIT (APPLIES TO TABLE 2)
Spec Number 511025-883
6
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