M28W320CT09GB1T 데이터 시트보기 (PDF) - STMicroelectronics

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M28W320CT09GB1T

32 Mbit (2Mb x16, Boot Block) Low Voltage Flash Memory

STMicroelectronics 

Table 21. AC Measurement Conditions

Input Rise and Fall Times

≤ 10ns

Input Pulse Voltages

0 to VDDQ

Input and Output Timing Ref. Voltages

VDDQ/2

Figure 5. AC Testing Input Output Waveform

VDDQ

0V

VDDQ/2

AI00610

M28W320CT, M28W320CB

Figure 6. AC Testing Load Circuit

VDDQ/2

1N914

DEVICE

UNDER

TEST

3.3kΩ

OUT

CL = 50pF

CL includes JIG capacitance

AI00609B

Table 22. Capacitance (1) (TA = 25 °C, f = 1 MHz)

Symbol

Parameter

Test Condition

CIN

Input Capacitance

VIN = 0V

COUT

Output Capacitance

VOUT = 0V

Note: 1. Sampled only, not 100% tested.

Min

Max

Unit

6

pF

12

pF

21/42

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