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MC100EP195FAG(2014) 데이터 시트보기 (PDF) - ON Semiconductor

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MC100EP195FAG
(Rev.:2014)
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MC100EP195FAG Datasheet PDF : 19 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
MC10EP195, MC100EP195
14000.0
13000.0
12000.0
11000.0
10000.0
9000.0
8000.0
7000.0
VCC = 0 V
VEE = −3.3 V
6000.0
5000.0
4000.0
3000.0
2000.0
1000.0
0.0
0.0
100.0 200.0
300.0
400.0
500.0
25°C
600.0 700.0
85°C
−40°C
800.0 900.0 1000.0
Decimal Value of Select Inputs (D[9:0])
Figure 4. Measured Delay vs. Select Inputs
Table 7. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
Positive Mode Power Supply
VEE
Negative Mode Power Supply
VI
Positive Mode Input Voltage
Negative Mode Input Voltage
Iout
Output Current
VEE = 0 V
VCC = 0 V
VEE = 0 V
VCC = 0 V
Continuous
Surge
VI VCC
VI VEE
6
V
−6
V
6
V
−6
V
50
mA
100
mA
IBB
VBB Sink/Source
TA
Operating Temperature Range
Tstg
Storage Temperature Range
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
LQFP−23
LQFP−23
±0.5
−40 to +85
−65 to +150
80
55
mA
°C
°C
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
qJA
Thermal Resistance (Junction−to−Ambient)
Standard Board
0 lfpm
500 lfpm
LQFP−23
QFN−32
QFN−32
12 to 17
31
27
°C/W
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
2S2P
QFN−32
12
°C/W
Tsol
Wave Solder
Pb−Free <2 to 3 sec @ 260°C
265
°C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
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