RDS (ON) – Ta
30
Common source
Pulse test
20
10
VGS = −4 V
ID = −13 A, −6.5 A, −3 A
−10 V
0
−80
−40
0
ID = −13 A, −6.5 A, −3 A
40
80
120
160
Ambient temperature Ta (°C)
TPC8112
−100
−10
−10
IDR – VDS
−5
−3
−1
VGS = 0 V
−1
−0.1
0
Common source
Ta = 25°C
Pulse test
0.2
0.4
0.6
0.8
1.0
1.2
Drain-source voltage VDS (V)
10000
3000
Capacitance – VDS
Ciss
1000
300
Coss
Crss
Common source
100 VGS = 0 V
f = 1 MHz
Ta = 25°C
30
−0.1 −0.3
−1
−3
−10
−30
Drain-source voltage VDS (V)
−100
Vth – Ta
−2.0
Common source
VDS = −10 V
−1.6
ID = −1 mA
Pulse test
−1.2
−0.8
−0.4
0
−80
−40
0
40
80
120
160
Ambient temperature Ta (°C)
2.0
(1)
1.6
1.2
(2)
0.8
PD – Ta
(1) Device mounted on a
glass-epoxy board (a)
(Note 2a)
(2) Device mounted on a
glass-epoxy board (b)
(Note 2b)
t = 10 s
0.4
0
0
40
80
120
160
200
Ambient temperature Ta (°C)
Dynamic input/output characteristics
−30
−30
Common source
VDD = −24 V
VDS
ID = −13 A
Ta = 25°C
Pulse test
−20
−20
−12
−10
−6
0
0
−6
VDD = −24 V −10
−12
VGS
0
40
80
120
160
200
Total gate charge Qg (nC)
5
2006-11-15