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WM8581 데이터 시트보기 (PDF) - Wolfson Microelectronics plc

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WM8581
Wolfson
Wolfson Microelectronics plc Wolfson
WM8581 Datasheet PDF : 94 Pages
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WM8581
Test Conditions
AVDD, PVDD, VREFP = 5V, DVDD = 3.3V, AGND, VREFN = 0V, PGND, DGND = 0V, TA = +25oC, 1kHz Signal, fs = 48kHz,
24-Bit Data, Slave Mode, MCLK, ADCMCLK = 256fs, 1Vrms Input Signal Level unless otherwise stated.
PARAMETER
SYMBOL TEST CONDITIONS
MIN
TYP
MAX
UNIT
Analogue Reference Levels
Reference voltage
VVMID
VREFP/2 – VREFP/2 VREFP/2 +
V
50mV
50mV
Potential divider resistance
RVMID
VREFP to VMID and
2050
k
VMID to VREFN
S/PDIF Transceiver Performance
Jitter on recovered clock
50
ps
S/PDIF Input Levels CMOS MODE
Input LOW level
VIL
0.3 X DVDD
V
Input HIGH level
VIH
0.7 X DVDD
V
Input capacitance
1.25
pF
Input Frequency
36
MHz
S/PDIF Input Levels Comparator MODE
Input capacitance
1.31
pF
Input resistance
18
Input frequency
25
MHz
Input Amplitude
200
0.5 X DVDD
mV
PLL
Period Jitter
80
ps(rms)
XTAL
Input XTI LOW level
VXIL
0
557
mV
Input XTI HIGH level
VXIH
853
mV
Input XTI capacitance
CXJ
3.32
4.491
pF
Input XTI leakage
Output XTO LOW
IXleak
VXOL
15pF load capacitors
28.92
86
38.96
mA
278
mV
Output XTO HIGH
VXOH
15pF load capacitors 1.458
1.942
V
Supply Current
Analogue supply current
AVDD, VREFP = 5V
45
mA
Analogue supply current
AVDD, VREFP = 3.3V
30
mA
Digital supply current
DVDD = 3.3V
16
mA
Power Down
10
µA
Table 5 Electrical Characteristics
Notes:
1. Ratio of output level with 1kHz full scale input, to the output level with all zeros into the digital input, measured ‘A’ weighted.
2. All performance measurements done with 20kHz low pass filter, and where noted an A-weight filter. Failure to use such a filter
will result in higher THD+N and lower SNR and Dynamic Range readings than are found in the Electrical Characteristics. The
low pass filter removes out of band noise; although it is not audible it may affect dynamic specification values.
3. VMID decoupled with 10uF and 0.1uF capacitors (smaller values may result in reduced performance).
w
PP Rev 1.0 March 2006
11

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