SST25PF080B 데이터 시트보기 (PDF) - Microchip Technology
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SST25PF080B Datasheet PDF : 32 Pages
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SST25PF080B
TABLE 5-5:
Symbol
NEND1
TDR1
ILTH1
RELIABILITY CHARACTERISTICS
Parameter
Minimum Specification
Endurance
10,000
Data Retention
100
Latch Up
100 + IDD
Units
Cycles
Years
mA
Test Method
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 5-6: AC OPERATING CHARACTERISTICS, 2.3-2.7V
25 MHz
Symbol
FCLK1
TSCKH
TSCKL
TSCKR2
TSCKF
TCES3
TCEH3
TCHS3
TCHH3
TCPH
TCHZ
TCLZ
TDS
TDH
THLS
THHS
THLH
THHH
THZ
TLZ
TOH
TV
TSE
TBE
TSCE
TBP
TPSID
Parameter
Serial Clock Frequency
Serial Clock High Time
Serial Clock Low Time
Serial Clock Rise Time (Slew Rate)
Serial Clock Fall Time (Slew Rate)
CE# Active Setup Time
CE# Active Hold Time
CE# Not Active Setup Time
CE# Not Active Hold Time
CE# High Time
CE# High to High-Z Output
SCK Low to Low-Z Output
Data In Setup Time
Data In Hold Time
HOLD# Low Setup Time
HOLD# High Setup Time
HOLD# Low Hold Time
HOLD# High Hold Time
HOLD# Low to High-Z Output
HOLD# High to Low-Z Output
Output Hold from SCK Change
Output Valid from SCK
Sector-Erase
Block-Erase
Chip-Erase
Byte-Program
Program Security ID
Min
Max
25
18
18
0.1
0.1
5
5
5
5
50
15
0
2
4
5
5
5
5
7
7
0
12
25
25
50
10
10
1. Maximum clock frequency for Read Instruction, 03H, is 25 MHz
2. Maximum Rise and Fall time may be limited by TSCKH and TSCKL requirements
3. Relative to SCK.
50 MHz
Min
Max
50
9
9
0.1
0.1
5
5
5
5
50
7
0
2
4
5
5
5
5
7
7
0
8
25
25
50
10
10
Units
MHz
ns
ns
V/ns
V/ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
ms
ms
µs
µs
DS25134A-page 20
2012 Microchip Technology Inc.
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