USBDFXXW5 데이터 시트보기 (PDF) - STMicroelectronics

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USBDFXXW5

EMI filter and line termination for USB downstream ports

STMicroelectronics 

Application information

USBDFxxW5

Figure 3.

Measurement configuration

Figure 4. USBDFxxW5 attenuation

curve

Insertion loss (dB)

0

50 Ω TG OUT

Vg

TEST BOARD

RF IN

50 Ω

-10

-20

-30

1

10

100

F (MHz)

1000 3000

2.2

ESD protection

In addition to the requirements of termination and EMC compatibility, computing devices are

required to be tested for ESD susceptibility. This test is described in the IEC 61000-4-2 and

is already in place in Europe. This test requires that a device tolerates ESD events and

remain operational without user intervention.

The USBDFxxW5 is particularly optimized to perform ESD protection. ESD protection is

based on the use of device which clamps at :

VINPUT = VBR + Rd.Ipp

This protection function is split in 2 stages. As shown in Figure 5., the ESD strikes are

clamped by the first stage S1 and then the remaining overvoltage is applied to the second

stage through the resistor R. Such a configuration makes the output voltage very low at the

Vout level.

Figure 5. USBDFxxW5 ESD clamping behavior

VPP

ESD Surge

Rg

S1

R

S2

Rd

Vinput

Rd

VBR

Voutput

VBR

USBDFxxW5

Rload

Device

to be

protected

4/11

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