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AS1109 데이터 시트보기 (PDF) - austriamicrosystems AG

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AS1109 Datasheet PDF : 25 Pages
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AS1109
Datasheet - Detailed Description
8.6 Detailed Error Reports
The detailed error report can be read out after global error mode has been run. On the falling edge of LD, the detailed error report of the selected
test is latched into the shift register and can be clocked out with n*8 clock cycles (n is the number of AS1109s in a chain) via pin SDO. At the
same time new data can be written into the shift register, which will load on the next rising edge of pin LD. This data will show at the output
drivers, at the falling edge of OEN.
8.6.1 Detailed Temperature Warning Report
The detailed temperature warning report can be read out immediately after global error mode has been run. Bit0 of the 8bit data word represents
the temperature flag of the chip.
Figure 15. Detailed Temperature Warning Report Timing Diagram
Global Flag Readout
Detailed Error Report Readout
OEN
LD
CLK
tGSW(ERROR)
t(SU)ERROR
tH(L)
tP4
SDI
SDO
TFLAG
tP4
For detailed timing information see Timing Diagrams on page 8.
DBit7
DBit6 DBit5 DBit4 DBit3 DBit2 DBit1 DBit0
New Data Input
Undefined
TBit0
Temperature Error Report Output
tP1
Don’t
Care
Don’t
Care
Detailed Temperature Warning Report Example
Consider a case where five AS1109s are cascaded in one chain. The detailed error report lists the temperatures for each device in the chain:
IC1:[70°] IC2:[85°] IC3:[66°] IC4:[160°] IC5:[76°]
In this case, IC4 is overheated and will generate a global error, and therefore 5*8 clock cycles are needed to write out the detailed temperature
warning report, and optionally read in new data. The detailed temperature warning report would look like this:
XXXXXXX1 XXXXXXX1 XXXXXXX1 XXXXXXX0 XXXXXXX1
The 0 in the detailed temperature warning report indicates that IC4 is the device with the over-temperature condition.
Note: In an actual report there are no spaces in the output.
www.ams.com/LED-Driver-ICs/AS1109
Revision 1.21
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