M29F200BT, M29F200BB
Figure 7. AC testing load circuit
1.3V
1N914
DC and ac parameters
DEVICE
UNDER
TEST
3.3kΩ
OUT
CL = 30pF or 100pF
CL includes JIG capacitance
AI03027
Table 11. DC characteristics (TA = 0 to 70°C, –40 to 85°C or –40 to 125°C)
Symbol
Parameter
Test Condition
Min Typ(1) Max Unit
ILI Input Leakage Current
ILO Output Leakage Current
ICC1 Supply Current (Read)
0V ≤ VIN ≤ VCC
0V ≤ VOUT ≤ VCC
E = VIL, G = VIH,
f = 6MHz
±1
µA
±1
µA
6
20
mA
ICC2 Supply Current (Standby) TTL
ICC3
Supply Current (Standby)
CMOS
ICC4(2)
Supply Current
(Program/Erase)
E = VIH
E = VCC ±0.2V,
RP = VCC ±0.2V
Program/Erase
Controller active
1
mA
30
100
µA
20
mA
VIL Input Low Voltage
VIH Input High Voltage
VOL Output Low Voltage
Output High Voltage TTL
VOH
Output High Voltage CMOS
VID
IID
VLKO(2)
Identification Voltage
Identification Current
Program/Erase Lockout Supply
Voltage
IOL = 5.8mA
IOH = –2.5mA
IOH = –100µA
A9 = VID
–0.5
2
2.4
VCC –0.4
11.5
3.2
0.8
V
VCC +0.5 V
0.45
V
V
V
12.5
V
100
µA
4.2
V
1. TA = 25°C, VCC = 5V.
2. Sampled only, not 100% tested.
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