AP28F010-120 데이터 시트보기 (PDF) - Intel
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AP28F010-120 Datasheet PDF : 23 Pages
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A28F010
AC TESTING INPUT OUTPUT WAVEFORM
AC TESTING LOAD CIRCUIT
290266 – 7
AC Testing Inputs are driven at 2 4V for a logic ‘‘1’’ and 0 45V for
a logic ‘‘0’’ Testing measurements are made at 2 0V for a logic
‘‘1’’ and 0 8V for a logic ‘‘0’’ Rise Fall time s 10 ns
CL e 100 pF
CL includes Jig Capacitance
290266 – 8
AC TEST CONDITIONS
Input Rise and Fall Times (10% to 90%)
10 ns
Input Pulse Levels
0 45V and 2 4V
Input Timing Reference Level
0 8V and 2 0V
Output Timing Reference Level
0 8V and 2 0V
AC CHARACTERISTICS Read-Only Operations(2)
Versions
Symbol
Characteristic
Notes
28F010-120
Min
Max
tAVAV tRC
Read Cycle Time
3
120
tELQV tCE
Chip Enable Access Time
120
tAVQV tACC Address Access Time
120
tGLQV tOE
Output Enable
50
Access Time
tELQX tLZ
Chip Enable to
Output in Low Z
3
0
tEHQZ
Chip Disable to
3
55
Output in High Z
tGLQX tOLZ
Output Enable to
Output in Low Z
3
0
tGHQZ tDF
Output Disable to
4
30
Output in High Z
tOH
Output Hold from Address
13
0
CE or OE Change
tWHGL
Write Recovery Time
6
before Read
NOTES
1 Whichever occurs first
2 Rise Fall Time s 10 ns
3 Not 100% tested characterization data available
4 Guaranteed by design
16
28F010-150
Unit
Min
Max
150
ns
150
ns
150
ns
55
ns
0
ns
55
ns
0
ns
35
ns
0
ns
6
ms
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