HCC40106BDG 데이터 시트보기 (PDF) - STMicroelectronics

부품명

상세내역

제조사

HCC40106BDG

Rad-hard, high voltage, CMOS logic series

STMicroelectronics 

Radiations

HCC40xxx, HCC45xxx

4.2

Single event effects (SEE)

The HCC logic series is characterized under heavy ions through four test vehicles,

representative of all the products with the same functional specification as described in

Table 5. The SEE class of each product is also provided in Table 5. The SEE performance of

any HCC device of the series is the performance of the class it belong to.

Table 5. HCC series, SEE class summary

Test vehicle

SEE class

HCC4014B

1

HCC4017B

2

HCC4093B

3

HCC4020B

4

The SEE performance of each SEE class is provided in Table 6.

Type

SEL

SEU

SET

Table 6. SEE performance of SEE classes

Class

Condition

Result

1, 2, 3, 4

1

2, 3

4

1, 2, 3, 4

125

LET =

°1C19, VMCeCV=.c2m02/Vm, g,

ion range = 20 µm, 45 ° tilt

25 °C, LET = 61 MeV.cm2/mg,

VCC = 5 V, VIN = 2.5 V ± 2.5 V,

fIN = 50 kHz, fCLOCK = 500 kHz,

VCC = 15 V, VIN = 7.5 V ± 7.5 V,

fIN = 100 kHz, fCLOCK = 1 MHz,

ion range = 20 µm, 45 ° tilt

25 °C, LET = 119 MeV.cm2/mg,

VCC = 5 V, VIN = 2.5 V ± 2.5 V,

fIN = 50 kHz, fCLOCK = 500 kHz,

VCC = 15 V, VIN = 7.5 V ± 7.5 V,

fIN = 100 kHz, fCLOCK = 1 MHz,

ion range = 20 µm, 45 ° tilt

25 °C, LET = 36 MeV.cm2/mg,

VCC = 5 V, VIN = 2.5 V ± 2.5 V,

fIN = 50 kHz, fCLOCK = 500 kHz,

VCC = 15 V, VIN = 7.5 V ± 7.5 V,

fIN = 100 kHz, fCLOCK = 1 MHz,

ion range = 20 µm, 45 ° tilt

25 °C, LET = 119 MeV.cm2/mg,

Trigger = ± 50 mV

VCC = 5 V, VIN = 2.5 V ± 2.5 V,

fIN = 50 kHz, VCC = 15 V,

VIN = 7.5 V ± 7.5 V, fIN = 100 kHz

No event

LETth >

60 MeV.cm2/mg,

σ sat = 8 x 10-6 cm2

No event

LETth >

36 MeV.cm2/mg,

σ sat = 1 x 10-4 cm2

No event

12/34

DocID17102 Rev 7

Share Link: