NXP Semiconductors
13. Test information
GTL2010
10-bit bidirectional low voltage translator
VCC1
200 kΩ
VCC2
150 Ω
VCC2
150 Ω
VCC2
150 Ω
DREF GREF D1
D10
DUT
SREF
Vref
pulse
generator
S1
S10
Fig 9. Load circuit for translator-type applications
test jig
002aac064
from output under test
CL
50 pF
RL
S1
500 Ω
RL
500 Ω
7V
open
GND
Test data are given in Table 12.
CL = load capacitance; includes jig and probe capacitance.
RL = load resistance.
Fig 10. Load circuit for CBT-type application
002aab667
Table 12. Test data
Test
tPD
tPLZ, tPZL
tPHZ, tPZH
Load
CL
50 pF
50 pF
50 pF
RL
500 Ω
500 Ω
500 Ω
Switch
open
7V
open
GTL2010_6
Product data sheet
Rev. 06 — 3 March 2008
© NXP B.V. 2008. All rights reserved.
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