74VHCT273A 데이터 시트보기 (PDF) - STMicroelectronics

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74VHCT273A

OCTAL D-TYPE FLIP FLOP WITH CLEAR

STMicroelectronics 

74VHCT273A

Table 9: Capacitive Characteristics

Test Condition

Value

Symbol

Parameter

TA = 25°C

-40 to 85°C -55 to 125°C Unit

CIN Input Capacitance

CPD Power Dissipation

Capacitance

(note 1)

Min. Typ. Max. Min. Max. Min. Max.

6 10

10

10 pF

16

pF

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/8 (per

Flip-Flop)

Table 10: Dynamic Switching Characteristics

Test Condition

Value

Symbol

Parameter

VCC

(V)

VOLP Dynamic Low

Voltage Quiet

5.0

VOLV Output (note 1, 2)

Dynamic High

VIHD Voltage Input

5.0

(note 1, 3)

Dynamic Low

VILD Voltage Input

5.0

(note 1, 3)

CL = 50 pF

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

0.6 0.9

-0.9 -0.6

2.0

V

0.8

1) Worst case package.

2) Max number of outputs defined as (n). Data inputs are driven 0V to 3.0V, (n-1) outputs switching and one output at GND.

3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.0V. Inputs under test switching: 3.0V to threshold (VILD), 0V to threshold

(VIHD), f=1MHz.

Figure 3: Test Circuit

CL =15/50pF or equivalent (includes jig and probe capacitance)

RT = ZOUT of pulse generator (typically 50Ω)

5/13

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