RH1014MJ 데이터 시트보기 (PDF) - Linear Technology
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RH1014MJ Datasheet PDF : 8 Pages
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RH1014M
TABLE 2: ELECTRICAL TEST REQUIRE E TS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group B and D for Class S, and
Group C and D for Class B
End Point Electrical Parameters (Method 5005)
* PDA applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3,4,5,6
1,2,3,4,5,6
1,2,3
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after
burn-in divided by the total number of devices submitted for burn-in in
that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
TOTAL DOSE BIAS CIRCUIT
10k
15V
–
10k
8V
+
–15V
RH1014M TDBC
TYPICAL PERFOR A CE CHARACTERISTICS
Supply Current (Per Amplifier)
0.8
VS = ±15V
RL = 10k
0.6
Positive Slew Rate
0.8
VS = ±15V
RL = 10k
0.6
Negative Slew Rate
0.8
VS = ±15V
RL = 10k
0.6
0.4
0.4
0.4
0.2
0.2
0.2
0
1
10
100
1000
TOTAL DOSE KRAD (Si)
RH1014M G01
0
1
10
100
1000
TOTAL DOSE KRAD (Si)
RH1014M G02
0
1
10
100
1000
TOTAL DOSE KRAD (Si)
RH1014M G03
4
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