HCTS00D 데이터 시트보기 (PDF) - Intersil

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HCTS00D

Radiation Hardened Quad 2-Input NAND Gate

Intersil 

Specifications HCTS00MS

TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS

OSCILLATOR

OPEN

GROUND

1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V

50kHz

25kHz

STATIC BURN-IN I TEST CONDITIONS (Note 1)

3, 6, 8, 11

1, 2, 4, 5, 7, 9, 10, 12,

-

13

14

-

-

STATIC BURN-IN II TEST CONNECTIONS (Note 1)

3, 6, 8, 11

7

-

1, 2, 4, 5, 9, 10, 12,

-

-

13, 14

DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)

-

7

3, 6, 8, 11

14

1, 2, 4, 5, 9, 10,

-

12, 13

NOTES:

1. Each pin except VCC and GND will have a resistor of 10KΩ ± 5% static burn-in.

2. Each pin except VCC and GND will have a resistor of 1KΩ ± 5% dynamic burn-in.

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V ± 0.5V

3, 6, 8, 11

7

1, 2, 4, 5, 9, 10, 12, 13, 14

NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5%. Group E, Subgroup 2,

sample size is 4 dice/wafer, 0 failures.

Spec Number 518774

374

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