HCTS27D/SAMPLE 데이터 시트보기 (PDF) - Intersil
부품명
상세내역
제조사
HCTS27D/SAMPLE Datasheet PDF : 9 Pages
| |||
Specifications HCTS27MS
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
PRE RAD
POST RAD
READ AND RECORD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OSCILLATOR
OPEN
GROUND
1/2 VCC = 3V ± 0.5V
VCC = 6V ± 0.5V
50kHz
25kHz
STATIC BURN-IN I TEST CONDITIONS (Note 1)
6, 8, 12
1 - 5, 7, 9, 10, 11, 13
-
14
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
6, 8, 12
7
-
1 - 5, 9, 10, 11, 13, 14
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
7
6, 8, 12
14
1 - 5, 9, 10, 11, 13
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10KΩ ± 5% for static burn-in.
2. Each pin except VCC and GND will have a resistor of 1KΩ ± 5% for dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
6, 8, 12
7
1 - 5, 9, 10, 11, 13, 14
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number 518643
434
Share Link: 