ADM1024(2000) 데이터 시트보기 (PDF) - Analog Devices
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ADM1024 Datasheet PDF : 28 Pages
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ADM1024
PIN FUNCTION DESCRIPTIONS
Pin
No. Mnemonic
Description
1
NTEST_OUT/ADD Digital I/O. Dual Function pin. This is a three-state input that controls the 2 LSBs of the Serial
Bus Address. This pin functions as an output when doing a NAND test.
2
THERM
Digital I/O. Dual Function pin. This pin functions as an interrupt output for temperature interrupts
only, or as an interrupt input for fan control. It has an on-chip 100 kΩ pull-up resistor.
3
SDA
Digital I/O. Serial Bus bidirectional Data. Open-drain output.
4
SCL
Digital Input. Serial Bus Clock.
5
FAN1/AIN1
Programmable Analog/Digital Input. 0 V to 2.5 V analog input or digital (0 to VCC) amplitude fan
tachometer input.
6
FAN2/AIN2
Programmable Analog/Digital Input. 0 V to 2.5 V analog input or digital (0 to VCC) amplitude fan
tachometer input.
7
CI
Digital I/O. An active high input from an external latch which captures a Chassis Intrusion event.
This line can go high without any clamping action, regardless of the powered state of the ADM1024. The
ADM1024 provides an internal open drain on this line, controlled by Bit 6 of Register 40h or Bit 7 of
Register 46h, to provide a minimum 20 ms pulse on this line, to reset the external Chassis Intrusion Latch.
8
GND
System Ground.
9
VCC
10
INT
POWER (2.8 V to 5.5 V). Typically powered from 3.3 V power rail. Bypass with the parallel combination of
10 µF (electrolytic or tantalum) and 0.1 µF (ceramic) bypass capacitors.
Digital Output. Interrupt Request (open-drain). The output is enabled when Bit 1 of Register 40h
is set to 1. The default state is disabled. It has an on-chip 100 kΩ pull-up resistor.
11 NTEST_IN/AOUT Digital Input/Analog Output. An active-high input that enables NAND Test mode board-level connectivity
testing. Refer to section on NAND testing. Also functions as a programmable analog output when NAND
Test is not selected.
12
RESET
Digital I/O. Master Reset, 5 mA driver (open drain), active low output with a 45 ms minimum pulsewidth.
Set using Bit 4 in Register 40h. Also acts as reset input when pulled low (e.g., power-on reset). It has an
on-chip 100 kΩ pull-up resistor.
13 D1–
Analog Input. Connected to cathode of first external temperature sensing diode.
14 D1+
Analog Input. Connected to anode of first external temperature sensing diode.
15
+12 VIN
16
+5 VIN
17
VCCP2/D2–
Programmable Analog Input. Monitors 12 V supply.
Analog Input. Monitors 5 V supply.
Programmable Analog Input. Monitors second processor core voltage or cathode of second external
temperature sensing diode.
18
+2.5 VIN/D2+
19
+VCCP1
20 VID4/IRQ4
Programmable Analog Input. Monitors 2.5 V supply or anode of second external temperature sensing diode.
Analog Input. Monitors 1st processor core voltage (0 V to 3.6 V).
Digital Input. Core Voltage ID readouts from the processor. This value is read into the VID4 Status Regis-
ter. Can also be reconfigured as an interrupt input. It has an on-chip 100 kΩ pull-up resistor.
21 VID3/IRQ3
Digital Input. Core Voltage ID readouts from the processor. This value is read into the VID0–VID3 Status
Register. Can also be reconfigured as an interrupt input. It has an on-chip 100 kΩ pull-up resistor.
22 VID2/IRQ2
Digital Input. Core Voltage ID readouts from the processor. This value is read into the VID0-VID3 Status
Register. Can also be reconfigured as an interrupt input. It has an on-chip 100 kΩ pull-up resistor.
23 VID1/IRQ1
Digital Input. Core Voltage ID readouts from the processor. This value is read into the VID0–VID3 Status
Register. Can also be reconfigured as an interrupt input. It has an on-chip 100 kΩ pull-up resistor.
24 VID0/IRQ0
Digital Input. Core Voltage ID readouts from the processor. This value is read into the VID0–VID3 Status
Register. Can also be reconfigured as an interrupt input. It has an on-chip 100 kΩ pull-up resistor.
REV. 0
–5–
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