CY7C1345-100AC(2000) 데이터 시트보기 (PDF) - Cypress Semiconductor
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CY7C1345-100AC Datasheet PDF : 16 Pages
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CY7C1345
Capacitance[8]
Parameter
CIN
CI/O
Description
Input Capacitance
I/O Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VDD = 5.0V
Max.
4.0
4.0
Unit
pF
pF
AC Test Loads and Waveforms
OUTPUT
Z0 =50Ω
RL =50Ω
VL =1.5V
(a)
3.3V
OUTPUT
5 pF
INCLUDING
JIG AND
SCOPE
R1=317Ω
3.0V
R2=351Ω
GND
10%
≤ 3.0 ns
(b)
ALL INPUT PULSES
90%
90%
10%
≤ 3.0 ns
Switching Characteristics Over the Operating Range[9]
-117
-100
-90
-50
Parameter
Description
Min. Max. Min. Max. Min. Max. Min. Max. Unit
tCYC
Clock Cycle Time
8.5
10
11
20
ns
tCH
Clock HIGH
3.0
4.0
4.5
4.5
ns
tCL
Clock LOW
3.0
4.0
4.5
4.5
ns
tAS
Address Set-Up Before CLK Rise
2.0
2.0
2.0
2.0
ns
tAH
Address Hold After CLK Rise
0.5
0.5
0.5
0.5
ns
tCDV
Data Output Valid After CLK Rise
7.5
8.0
8.5
11.0 ns
tDOH
Data Output Hold After CLK Rise
2.0
2.0
2.0
2.0
ns
tADS
ADSP, ADSC Set-Up Before CLK Rise
2.0
2.0
2.0
2.0
ns
tADH
ADSP, ADSC Hold After CLK Rise
0.5
0.5
0.5
0.5
ns
tWES
BWS[1:0], GW,BWE Set-Up Before CLK Rise 2.0
2.0
2.0
2.0
ns
tWEH
BWS[1:0], GW,BWE Hold After CLK Rise
0.5
0.5
0.5
0.5
ns
tADVS
ADV Set-Up Before CLK Rise
2.0
2.0
2.0
2.0
ns
tADVH
ADV Hold After CLK Rise
0.5
0.5
0.5
0.5
ns
tDS
Data Input Set-Up Before CLK Rise
2.0
2.0
2.0
2.0
ns
tDH
Data Input Hold After CLK Rise
0.5
0.5
0.5
0.5
ns
tCES
Chip Enable Set-Up
2.0
2.0
2.0
2.0
ns
tCEH
tCHZ
tCLZ
tEOHZ
tEOLZ
Chip Enable Hold After CLK Rise
Clock to High-Z[10, 11]
Clock to Low-Z[10, 11]
OE HIGH to Output High-Z[10, 12]
OE LOW to Output Low-Z[10, 12]
0.5
0.5
0.5
0.5
ns
3.5
3.5
3.5
3.5 ns
0
0
0
0
ns
3.5
3.5
3.5
3.5 ns
0
0
0
0
ns
tEOV
OE LOW to Output Valid
3.5
3.5
3.5
3.5 ns
Notes:
8. Tested initially and after any design or process changes that may affect these parameters.
9. Unless otherwise noted, test conditions assume signal transition time of 2.5 ns or less, timing reference levels of 1.25V, input pulse levels of 0 to 2.5V, and
output loading of the specified IOL/IOH and load capacitance. Shown in (a) and (b) of AC test loads.
10. tCHZ, tCLZ, tEOHZ, and tEOLZ are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.
11. At any given voltage and temperature, tCHZ (max) is less than tCLZ (min).
12. This parameter is sampled and not 100% tested.
9
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