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ICS307

Serially programmable clock source

Integrated Circuit Systems 

ICS307

Serially Programmable Clock Source

Electrical Specifications

Parameter

Conditions

Minimum

ABSOLUTE MAXIMUM RATINGS (Note 1)

Supply Voltage, VDD

Referenced to GND

Inputs

Referenced to GND

-0.5

Clock Output

Referenced to GND

-0.5

Ambient Operating Temperature

0

Ambient Operating Temperature, Industrial

I version

-40

Soldering Temperature

Max of 10 seconds

Storage temperature

-65

DC CHARACTERISTICS (VDD = 5.0 V unless otherwise noted)

Operating Voltage, VDD

3

Input High Voltage, VIH, X1/ICLK only

ICLK (Pin 1)

(VDD/2)+1

Input Low Voltage, VIL, X1/ICLK only

ICLK (Pin 1)

Input High Voltage, VIH

2

Input Low Voltage, VIL

PDTS, ICS307-01 only

All other inputs,-01 & -02

Output High Voltage, VOH, CMOS level

IOH=-4 mA

VDD-0.4

Output High Voltage, VOH

IOH=-25 mA

2.4

Output Low Voltage, VOL

IOL=25 mA

IDD Operating Supply Current, 20 MHz crystal No Load, 100 MHz out

100MHz out,VDD=3.3V

Short Circuit Current

CLK1 and CLK2 outputs

On-Chip Pull-up Resistor

Pin 13

Input Capacitance

AC CHARACTERISTICS

Input Frequency, crystal input (must be fundamental)

5

Input Frequency, clock input

2

Output Frequency (See Table 1)

VDD = 3.0 to 5.5V

6

Output Frequency (see Table 1), I version

VDD = 3.0 to 5.5V

6

Output Clock Rise Time

0.8 to 2.0V

Output Clock Fall Time

2.0 to 0.8V

Output Clock Duty Cycle, even output divides

At duty cycle level

45

Output Clock Duty Cycle, odd output divides

At duty cycle level

40

Power-up time, STROBE goes high until CLK out

Absolute Maximum Clock Period Jitter

Deviation from mean

One Sigma Clock Period Jitter

Typical

VDD/2

VDD/2

26

13

±70

270

4

1

1

49 to 51

3

±120

50

Maximum Units

7

V

VDD+0.5 V

VDD+0.5 V

70

°C

85

°C

260

°C

150

°C

5.5

V

V

(VDD/2)-1 V

V

0.4

V

0.8

V

V

0.4

V

mA

mA

mA

kΩ

pF

27

MHz

50

MHz

200

MHz

180

MHz

ns

ns

55

%

60

%

10

ms

ps

ps

Notes:

1. Stresses beyond those listed under Absolute Maximum Ratings could cause permanent damage to the device. Prolonged exposure

to levels above the operating limits but below the Absolute Maximums may affect device reliability.

2. Typical values are at 25°C.

MDS 307 D

7

Revision 042501

Integrated Circuit Systems, Inc. • 525 Race Street • San Jose •CA•95126•(408) 295-9800tel •www.icst.com

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