ADIS16204/PCBZ 데이터 시트보기 (PDF) - Analog Devices

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ADIS16204/PCBZ

Programmable High-g Digital Impact Sensor and Recorder

Analog Devices 

ADIS16204

Parameter

Conditions

Axis Min Typ

Max Unit

LOGIC INPUTS3

Input High Voltage, VINH

2.0

V

Input Low Voltage, VINL

0.8 V

Logic 1 Input Current, IINH

VIH = VDD

±0.2

±1 μA

Logic 0 Input Current, IINL

VIL = 0 V

−40

−60 μA

Input Capacitance, CIN

10

pF

DIGITAL OUTPUTS

Output High Voltage, VOH

ISOURCE = 1.6 mA

2.4

V

Output Low Voltage, VOL

ISINK = 1.6 mA

0.4 V

SLEEP TIMER

Timeout Period4

START-UP TIME

Initial

Reset recovery

FLASH MEMORY

E Endurance5

Data Retention6

CONVERSION RATE

T Maximum Throughput Rate

Minimum Throughput Rate

POWER SUPPLY

Operating Voltage Range, VDD

LE Power Supply Current

TJ = 85°C

Normal mode, SMPL_PRD ≥ 0x08

(fS ≤ 910 Hz), at 25°C

Fast mode, SMPL_PRD ≤ 0x07

(fS ≥ 1024 Hz), at 25°C

Sleep mode, at 25°C

0.5

130

2.5

20,000

20

4096

2.066

3.0

3.3

12

37

150

128 Seconds

ms

ms

Cycles

Years

SPS

SPS

3.6 V

15 mA

43 mA

μA

1 Note that gravity can impact this number; zero-g condition assumes both axes oriented normal to the earth’s gravity.

2 Self-test response changes as the square of VDD.

O 3 Note that the inputs are +5 V tolerant.

4 Guaranteed by design.

5 Endurance is qualified as per JEDEC Standard 22, Method A117 and measured at −40°C, +25°C, +85°C, and +105°C.

OBS 6 Retention lifetime equivalent at junction temperature (TJ), 55°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.

Rev. B | Page 4 of 24

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