2026AIVZ 데이터 시트보기 (PDF) - Intersil
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2026AIVZ Datasheet PDF : 24 Pages
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ISL12026, ISL12026A
AC Electrical Specifications (Continued)
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
(Note 16)
MAX
TYP (Note 16) UNITS NOTES
tSU:STO STOP Condition Set-up Time
From SCL rising edge crossing 70%
600
of VDD, to SDA rising edge crossing
30% of VDD.
tHD:STO STOP Condition Hold Time for
From SDA rising edge to SCL falling
600
Read or Volatile Only Write
edge. Both crossing 70% of VDD.
tDH
Output Data Hold Time
From SCL falling edge crossing 30%
0
of VDD, until SDA enters the 30% to
70% of VDD window.
Cpin SDA and SCL Pin Capacitance
ns
ns
ns
10
pF
tWC Non-volatile Write Cycle Time
tR
SDA and SCL Rise Time
From 30% to 70% of VDD
tF
SDA and SCL Fall Time
From 70% to 30% of VDD
Cb
Capacitive Loading of SDA or SCL Total on-chip and off-chip
12
20
ms
14
20 + 0.1xCb
300
ns
20 +0.1xCb
300
ns
15
10
400
pF
15
RPU SDA and SCL Bus Pull-up Resistor Maximum is determined by tR and tF.
1
Off-chip
For Cb = 400pF, max is about
2kΩ~2.5kΩ.
For Cb = 40pF, max is about
15kΩ~20kΩ
kΩ
15
NOTES:
7. IRQ/FOUT Inactive.
8. VIL = VDD x 0.1, VIH = VDD x 0.9, fSCL = 400kHz
9. VDD > VBAT +VBATHYS
10. Bit BSW = 0 (Standard Mode), ATR = 00h, VBAT ≥1.8V
11. Specified at +25°C.
12. In order to ensure proper timekeeping, the VDD SR- specification must be followed.
13. Parameter is not 100% tested.
14. tWC is the minimum cycle time to be allowed for any non-volatile Write by the user, it is the time from valid STOP condition at the end of Write
sequence of a serial interface Write operation, to the end of the self-timed internal non-volatile write cycle.
15. These are I2C specific parameters and are not directly tested, however they are used during device testing to validate device specification.
16. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
Timing Diagrams
Bus Timing
SCL
tSU:STA
SDA
(INPUT TIMING)
SDA
(OUTPUT TIMING)
tF
tHIGH
tSU:DAT
tHD:STA
tLOW
tR
tHD:DAT
tAA
tDH
tHD:STO
tSU:STO
tBUF
5
FN8231.9
November 30, 2010
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