FS612510-01 데이터 시트보기 (PDF) - AMI Semiconductor
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FS612510-01 Datasheet PDF : 8 Pages
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FS612510-01/-02
1:10 Zero-Delay Clock Buffer IC
AMERICAN MICROSYSTEMS, INC.
November 2000
5.0 Electrical Specifications
Table 3: Absolute Maximum Ratings
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These conditions represent a stress rating only, and functional operation of the device at
these or any other conditions above the operational limits noted in this specification is not implied. Exposure to maximum rating conditions for extended conditions may affect device performance,
functionality, and reliability.
PARAMETER
SYMBOL
MIN.
MAX.
UNITS
Supply Voltage, dc, Clock Buffers (VSS = ground)
Supply Voltage, dc, Core
Input Voltage, dc
Output Voltage, dc
Input Clamp Current, dc (VI < 0 or VI > VDD)
Output Clamp Current, dc (VI < 0 or VI > VDD)
Storage Temperature Range (non-condensing)
Ambient Temperature Range, Under Bias
Junction Temperature
Lead Temperature (soldering, 10s)
Static Discharge Voltage Protection (MIL-STD 883E, Method 3015.7)
AVDD
VSS - 0.5
7
V
VDD
VSS - 0.5
7
V
VI
VSS - 0.5
VDD+0.5
V
VO
VSS - 0.5
VDD+0.5
V
IIK
-50
50
mA
IOK
-50
50
mA
TS
-65
150
°C
TA
-55
125
°C
TJ
125
°C
260
°C
2
kV
CAUTION: ELECTROSTATIC SENSITIVE DEVICE
Permanent damage resulting in a loss of functionality or performance may occur if this device is subjected to a high-energy
electrostatic discharge.
Table 4: Operating Conditions
PARAMETER
Supply Voltage, Core and Outputs
Ambient Operating Temperature Range
Output Load Capacitance
Input Frequency
Input Duty Cycle
Input Rise/Fall Time
SYMBOL
VDD
TA
CL
fCLK
CONDITIONS/DESCRIPTION
3.3V ± 10%
CLK
CLK
CLK
MIN.
3.0
0
50
40
TYP.
3.3
MAX.
3.6
70
15
140
60
3
UNITS
V
°C
pF
MHz
%
ns
ISO9001
QS9000
4
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