GT28F400B3B150 데이터 시트보기 (PDF) - Intel

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GT28F400B3B150

SMART 3 ADVANCED BOOT BLOCK WORD-WIDE 4-MBIT (256K X 16), 8-MBIT (512K X 16), 16-MBIT (1024K X 16) FLASH MEMORY FAMILY

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SMART 3 ADVANCED BOOT BLOCK–WORD-WIDE

E

VCCQ

0.0

INPUT

VCCQ

2

TEST POINTS

VCCQ OUTPUT

2

0580_11

NOTE:

AC test inputs are driven at VCCQ for a logic “1” and 0.0V for a logic “0.” Input timing begins, and output timing ends, at VCCQ/2.

Input rise and fall times (10%–90%) <10 ns. For worst case speed conditions VCCQ = 1.8V.

Figure 13. 1.8V—2.2V Input Range and Measurement Points

Device

under

Test

VCCQ

R1

CL

R2

Test Configuration Component Values for Worst

Case Speed Conditions

Test Configuration

1.8V Standard Test

CL (pF) R1 (Ω) R2 (Ω)

50 16.7K 16.7K

NOTE:

CL includes jig capacitance.

Out

NOTE:

See table for component values.

Figure 14. Test Configuration

0580_12

38

PRELIMINARY

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