HEF4093BP 데이터 시트보기 (PDF) - NXP Semiconductors.

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HEF4093BP

Quadruple 2-input NAND Schmitt trigger

NXP Semiconductors. 

NXP Semiconductors

12. Waveforms

HEF4093B

Quad 2-input NAND Schmitt trigger

VI

input

10 %

0V

tr

90 %

VM

tPHL

VOH

output

VOL

90 %

VM

10 %

tTHL

tf

tPLH

tTLH

001aag197

Fig 4.

Measurement points are given in Table 9.

Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.

tr, tf = input rise and fall times.

Propagation delay and output transition time

Table 9. Measurement points

Supply voltage

VDD

5 V to 15 V

Input

VM

0.5VDD

Output

VM

0.5VDD

VDD

VI

G

VO

DUT

RT

CL

001aag182

Fig 5.

Test data given in Table 10.

Definitions for test circuit:

DUT = Device Under Test.

CL = load capacitance including jig and probe capacitance.

RT = termination resistance should be equal to the output impedance Zo of the pulse generator.

Test circuit

Table 10. Test data

Supply voltage

VDD

5 V to 15 V

Input

VI

VSS or VDD

tr, tf

 20 ns

Load

CL

50 pF

HEF4093B

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 8 — 21 November 2011

© NXP B.V. 2011. All rights reserved.

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