MC74F3893AFN 데이터 시트보기 (PDF) - Motorola => Freescale
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MC74F3893AFN Datasheet PDF : 5 Pages
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MC74F3893A
DC CHARACTERISTICS (Over Recommended Operating Free-Air Temperature Range Unless otherwise specified)
Symbol
Parameter
Limits
Min Typ (2) Max Unit
Test Conditions
(Note 1)
VOH High-Level Output Voltage
Rn
VOHB
High-Level Output Bus Voltage
I/On
VOL Output LOW Voltage
Rn
2.5
—
—
V
VCC = MIN: VIL = 1.3 V; RE = 0.8 V:
IOH = MAX
1.9
—
VCC = MAX: DN = DE = 0.8 V:
—
V VT = 2.0 V: RT = 10Ω: RE = 2.0 V
IOH = MAX
—
0.35
0.5
V
VCC = MIN: VIN = 1.8 V; RE = 0.8 V: IOL =
6.0 mA
VOLB Low Level Output Bus Voltage
I/On
0.75
1.0
0.75
1.0
1.2
Dn = DE = VIH: IOL = 100 mA
V
1.1
Dn = DE = VIH: IOL = 80 mA
Driver Output Positive
VOCB Clamp Voltage
—
—
2.9
VCC = MAX or 0 V: DN = I/On = 1.0 mA
I/On
V DE = 0.8 V:
—
—
3.2
RE = 2.0 V
I/On = 10 mA
VIK
Input Clamp Diode Voltage
—
II
Input Current at Maximum Input Voltage
—
IIH
High Level Input Current
Dn, RE, DE —
IIHB
High-Level I/O Bus Current
(Power Off)
I/On
—
–0.73 –1.2 V VCC = MIN, II = IIK
—
100 µA VCC = MAX: VI = 7.0 V: DE = RE = Dn = VCC
—
20
µA VCC = MAX: DE = RE = Dn = 2.5 V
—
100
µA
VCC = 0 V: DN = DE = 0.8 V:
I/On = 1.2 V: RE = 0 V:
IIL
Low-Level Input Current
RE
—
—
–100
Dn
—
—
–200 µA VCC = MAX:
DE
—
—
–500
VI = 0.5V:
DE = 4.5 V
Dn = 4.5 V
IILB
Low-Level I/O Bus Current
(Power On)
I/On
–250
—
100
µA
VCC = MAX: Dn = DE = 0.8 V:
I/On = 0.75 V : RE = 0 V:
IOZH
Off-State Output Current, High-
Level Voltage Applied
—
—
20
VO = 2.5V:
µA RE = 2.0 V
IOZL
IOS
Off-State Output Current,
Low-Level Voltage Applied
Output Short Circuit Current
(Note 3)
Rn
—
—
–20
VCC = MAX:
VO = 0.5 V: RE = 2.0 V
VCC = MAX:
–80
—
–200
mA
Dn = 1.2 V: VO = 0 V: RE
= 0.8 V
ICC
Supply Current (Total )
—
55
80 mA VCC = MAX: (RE = VIH or VIL)
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable device type.
2. All typical values are at VCC = 5.0 V, TA = + 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are prefer-
able in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip
temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be
performed last.
FAST AND LS TTL DATA
4-275
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