MC10H145L 데이터 시트보기 (PDF) - Motorola => Freescale
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MC10H145L Datasheet PDF : 5 Pages
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MC10H145
AC PARAMETERS
Characteristics
Read Mode
Chip Select Access Time
Chip Select Recovery Time
Address Access Time
Write Mode
Write Pulse Width
Data Setup Time Prior to Write
Data Hold Time After Write
Address Setup Time Prior to Write
Address Hold Time After Write
Chip Select Setup Time Prior to Write
Chip Select Hold Time After Write
Write Disable Time
Write Recovery Time
Chip Enable Strobe Mode
Data Setup Prior to Chip Select
Write Enable Setup Prior to Chip Select
Address Setup Prior to Chip Select
Data Hold Time After Chip Select
Write Enable Hold Time After Chip Select
Address Hold Time After Chip Select
Chip Select Minimum Pulse Width
Rise and Fall Time
Address to Output
CS to Output
Capacitance
Input Capacitance
Output Capacitance
Symbol
tACS
tRCS
tAA
tW
tWSD
tWHD
tWSA
tWHA
tWSCS
tWHCS
tWS
tWR
tCSD
tCSW
tCSA
tCHD
tCHW
tCHA
tCS
tr, tf
Cin
Cout
MC10H145
TA = 0 to +75°C,
VEE = –5.2 Vdc ±5%
Min
Max
0
4.0
0
4.0
0
6.0
6.0
—
0
—
1.5
—
3.5
—
1.5
—
0
—
1.5
—
1.0
4.0
1.0
4.0
0
—
0
—
0
—
1.0
—
0
—
2.0
—
4.0
—
0.6
2.5
0.6
2.5
—
6.0
—
8.0
Unit
Conditions
ns Measured from 50% of input to 50%
of output. See Note 2.
ns tWSA = 3.5 ns
Measured at 50% of input to 50% of
output. tW = 6.0 ns.
ns Guaranteed but not tested on
standard product. See Figure 1.
ns Measured between 20% and 80%
points.
pF Measured with a pulse technique.
p NOTES: 1. Test circuit characteristics: RT = 50 Ω, MC10H145. CL 5.0 pF (including jig and Stray Capacitance). Delay should be derated 30 ps/pF for
capacitive loads up to 50 pF.
2. The maximum Address Access Time is guaranteed to be the worst-case bit in the memory.
3. For proper use of MECL in a system environment, consult MECL System Design Handbook.
FIGURE 1 — CHIP ENABLE STROBE MODE
A
TCSD
DIN
TCSW
WE
TCSA
TCS
CS
TCHA
TCHD
TCHW
MOTOROLA
2–234
MECL Data
DL122 — Rev 6
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