PBHV8540T 데이터 시트보기 (PDF) - NXP Semiconductors.
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PBHV8540T Datasheet PDF : 12 Pages
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NXP Semiconductors
8. Test information
PBHV8540T
500 V, 0.5 A NPN high-voltage low VCEsat (BISS) transistor
VBB
VCC
(probe)
oscilloscope
450 Ω
VI
RB
R2
R1
Fig 11. Test circuit for switching times
RC
Vo (probe)
oscilloscope
450 Ω
DUT
mlb826
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
9. Package outline
2.5 1.4
2.1 1.2
3.0
2.8
3
1.1
0.9
0.45
0.15
1
1.9
Dimensions in mm
Fig 12. Package outline SOT23 (TO-236AB)
2
0.48
0.38
0.15
0.09
04-11-04
10. Packing information
PBHV8540T_2
Product data sheet
Table 8. Packing methods
The indicated -xxx are the last three digits of the 12NC ordering code.[1]
Type number Package Description
PBHV8540T SOT23
4 mm pitch, 8 mm tape and reel
Packing quantity
3 000
10 000
-215
-235
[1] For further information and the availability of packing methods, see Section 14.
Rev. 02 — 14 January 2009
© NXP B.V. 2009. All rights reserved.
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