74HC4851 데이터 시트보기 (PDF) - NXP Semiconductors.

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74HC4851

8-channel analog multiplexer/demultiplexer with injection-current effect control

NXP Semiconductors. 

NXP Semiconductors

74HC4851; 74HCT4851

8-channel analog MUX/DEMUX with injection-current effect control

E

VIH

IS Yn

VI

VCC

Z

IS

GND

VO

001aaf878

Fig 6. Test circuit for measuring OFF-state leakage

current

Yn

IS

VCC

selected

channel(1)

VI

E

VIL

Z

n.c.

Yn

any disabled

channel

VO

GND

001aaf879

(1) Channel is selected by S0, S1 and S2.

Fig 7. Test circuit for measuring ON-state leakage

current

VSW

V

VCC

E

VIL

Yn

Z

VI

GND

RON = VSW / ISW.

ISW

001aaf880

Fig 8. Test circuit for measuring ON resistance

VI(1)

ISW

VIL

VI(2)

RS

VI

VCC

any disabled

channel

Yn

Z

E

Yn

selected

channel(1)

GND

VO

001aaf881

(1) Channel is selected by S0, S1 and S2.

VI(1) < GND or VI(1) > VCC.

GND < VI(2) < VCC.

Fig 9. Test circuit for injection current coupling

74HC_HCT4851_2

Product data sheet

Rev. 02 — 2 September 2008

© NXP B.V. 2008. All rights reserved.

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