DAC8043 데이터 시트보기 (PDF) - Analog Devices
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DAC8043 Datasheet PDF : 16 Pages
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DAC8043
Parameter
POWER SUPPLY
Supply Voltage
Supply Current
Symbol Conditions
VDD
IDD
Digital inputs = VIH or VIL
Digital inputs = 0 V or VDD
Min Typ
4.75 5
1 ±1/2 LSB = ±0.012% of full scale.
2 All grades are monotonic to 12 bits over temperature.
3 Using internal feedback resistor.
4 Guaranteed by design and not tested.
5 Applies to IOUT; all digital inputs = 0 V.
6 VREF = 10 V; all digital inputs = 0 V.
7 Calculated from worst-case RREF: IZSE (in LSBs) = (RREF × ILKG × 4096)/VREF.
8 Absolute temperature coefficient is less than 300 ppm/°C.
9 IOUT load = 100 Ω , CEXT = 13 pF, digital input = 0 V to VDD or VDD to 0 V. Extrapolated to ½ LSB; tS = propagation delay (tPD) + 9τ
where τ = measured time constant of the final RC decay.
10 VREF = 0 V, all digital inputs = 0 V to VDD or VDD to 0 V.
11 All digit inputs = 0 V.
12 Calculations from en = √4K TRB
where:
K = Boltzmann constant, J/°K,
R = resistance, Ω,
T = resistor temperature, °K,
B = bandwidth, Hz.
13 Digital inputs are CMOS gates; IIN is typically 1 nA at 25°C.
14 Tested at VIN = 0 V or VDD.
Max Unit
5.25 V
500 μA
100 μA
WAFER TEST LIMITS
VDD = 5 V, VREF = 10 V; IOUT = GND = 0 V, TA = 25°C.
Table 2.
Parameter1
STATIC ACCURACY
Resolution
Integral Nonlinearity
Differential Nonlinearity
Gain Error
Power Supply Rejection Ratio
Output Leakage Current (IOUT)
REFERENCE INPUT
Input Resistance
DIGITAL INPUTS
Digital Input High
Digital Input Low
Input Leakage Current
POWER SUPPLY
Supply Current
Symbol
N
INL
DNL
GFSE
PSRR
ILKG
RIN
VIH
VIL
IIL
IDD
Conditions
Using internal feedback resistor
ΔVDD = ±5%
Digital inputs = VIL
VIN = 0 V to VDD
Digital inputs = VIN or VIL
Digital inputs = 0 V or VDD
DAC8043GBC Limit
Min Typ Max
Unit
12
Bits
±1
LSB
±1
LSB
±2
LSB
±0.002 %/%
±5
nA
7
15
kΩ
2.4
V
0.8
V
±1
μA
500
μA
100
μA
1 Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult a factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
Rev. E | Page 4 of 16
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