24LC320 데이터 시트보기 (PDF) - Microchip Technology

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24LC320

32K 2.5V SPI™ Bus Serial EEPROM

Microchip Technology 

25LC320

TABLE 1-3: AC CHARACTERISTICS

Applicable over recommended operating ranges shown below unless otherwise noted:

VCC = 2.5V to 5.5V

Commercial (C): Tamb = 0°C to +70°C

Industrial (I):

Tamb = -40°C to +85°C

Symbol

Parameter

Min

Max

Units

Test Conditions

fSCK

Clock Frequency

—

3

MHz VCC=4.5V to 5.5V

—

2

MHz VCC=2.5V to 4.5V

tCSS

CS Setup Time

100

—

250

—

ns

VCC=4.5V to 5.5V

ns

VCC=2.5V to 4.5V

tCSH

CS Hold Time

100

—

250

—

ns

VCC=4.5V to 5.5V

ns

VCC=2.5V to 4.5V

tCSD

CS Disable Time

250

—

500

—

ns

VCC=4.5V to 5.5V

ns

VCC=2.5V to 4.5V

tSU

Data Setup Time

30

—

50

—

ns

VCC=4.5V to 5.5V

ns

VCC=2.5V to 4.5V

tHD

Data Hold Time

50

—

ns

VCC=4.5V to 5.5V

100

—

ns

VCC=2.5V to 4.5V

tR

CLK Rise Time

—

2

µs

(Note 1)

tF

CLK Fall Time

—

2

µs

(Note 1)

tHI

Clock High Time

150

—

250

—

ns

VCC=4.5V to 5.5V

ns

VCC=2.5V to 4.5V

tLO

Clock Low Time

150

—

250

—

ns

VCC=4.5V to 5.5V

ns

VCC=2.5V to 4.5V

tCLD

Clock Delay Time

50

—

ns

tV

Output Valid from

—

150

ns

VCC=4.5V to 5.5V

Clock Low

—

250

ns

VCC=2.5V to 4.5V

tHO

Output Hold Time

0

—

ns

tDIS

Output Disable Time

—

200

—

250

ns

VCC=4.5V to 5.5V (Note 1)

ns

VCC=2.5V to 4.5V (Note 1)

tHS

HOLD Setup Time

100

—

100

—

ns

VCC=4.5V to 5.5V

ns

VCC=2.5V to 4.5V

tHH

HOLD Hold Time

100

—

100

—

ns

VCC=4.5V to 5.5V

ns

VCC=2.5V to 4.5V

tHZ

HOLD Low to Output High-Z

100

—

150

—

ns

VCC=4.5V to 5.5V (Note 1)

ns

VCC=2.5V to 4.5V (Note 1)

tHV

HOLD High to Output Valid

100

—

150

—

ns

VCC=4.5V to 5.5V (Note 1)

ns

VCC=2.5V to 4.5V (Note 1)

tWC

Internal Write Cycle Time

—

5

ms

(Note 2)

—

Endurance

1M

— E/W Cycles 25°C, Vcc = 5.0V, Block Mode

(Note 3)

Note 1: This parameter is periodically sampled and not 100% tested.

2: tWC begins on the rising edge of CS after a valid write sequence and ends when the internal self-timed write

cycle is complete.

3: This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific appli-

cation, please consult the Total Endurance Model which can be obtained on our BBS or website.

DS21158B-page 4

Preliminary

© 1996 Microchip Technology Inc.

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