28F016XD-95 데이터 시트보기 (PDF) - Intel

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28F016XD-95

16-MBIT (1 MBIT x 16) DRAM-INTERFACE FLASH MEMORY

Intel 

E

5.3 Transient Input/Output Reference Waveforms

28F016XD FLASH MEMORY

2.4

2.0

INPUT

TEST POINTS

2.0

OUTPUT

0.8

0.8

0.45

0533_05

AC test inputs are driven at VOH (2.4 VTTL) for a Logic “1” and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at VIH

(2.0 VTTL) and VIL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise and fall times (10% to 90%) <10 ns.

Figure 5. Transient Input/Output Reference Waveform for VCC = 5.0V ± 0.5V(1)

3.0

INPUT

1.5

TEST POINTS

1.5 OUTPUT

0.0

0533_06

AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.

Input rise and fall times (10% to 90%) <10 ns.

Figure 6. Transient Input/Output Reference Waveform for VCC = 3.3V ± 0.3V(2)

NOTES:

1. Testing characteristics for 28F016XD-85.

2. Testing characteristics for 28F016XD-95.

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