74F132 데이터 시트보기 (PDF) - Philips Electronics
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74F132 Datasheet PDF : 8 Pages
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Philips Semiconductors
Quad 2-input NAND Schmitt trigger
Product specification
74F132
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
VT+
Positive-going threshold
VCC = 5.0V
1.5
1.7
2.0
V
VT–
Negative-going threshold–
VCC = 5.0V
0.7
0.9
1.1
V
nVT
Hysteresis (VT+ – VT–)
VCC = 5.0V
0.4
0.8
V
VOH
High-level output voltage
VCC = MIN,
±10%VCC
2.5
V
VI=VT–MAX, IOH = MAX
±5%VCC
2.7
3.4
VOL
Low-level output voltage
VCC = MIN,
VI=VT+MAX, IOL = MAX
±10%VCC
±5%VCC
0.30 0.50
V
0.30 0.50
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
V
IT+
Input current at positive-going threshold VCC = 5.0V, VI=VT+
0
µA
IT–
Input current at negative-going threshold VCC = 5.0V, VI=VT–
–350
µA
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
IOS
Short-circuit output current3
VCC = MAX, VI = 0.5V
VCC = MAX
–0.6
mA
–60
–150
mA
ICC
Supply current (total)
ICCH VCC = MAX
ICCL
VI N= GND
VIN = 4.5V
8.5
12.0
mA
13.0 19.5
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1991 Jun 26
4
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