74HC4852 데이터 시트보기 (PDF) - NXP Semiconductors.

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74HC4852

Dual 4-channel analog multiplexer/demultiplexer with injection-current effect control

NXP Semiconductors. 

NXP Semiconductors

74HC4852; 74HCT4852

4-channel analog MUX/DEMUX with injection-current effect control

VIH

E

IS nYn

VI

VCC

nZ IS

GND

VO

001aag098

Fig 6. Test circuit for measuring OFF-state leakage

current

VCC

IS nYn selected channel(1)

VI

nZ n.c.

VIL

VO

E

nYn

any disabled channel

GND

001aag099

(1) Channel is selected by S0 and S1.

Fig 7. Test circuit for measuring ON-state leakage

current

VIL

E

nYn

VI

VSW

V

VCC

nZ

GND

RON = VSW / ISW.

ISW

001aag100

Fig 8. Test circuit for measuring ON resistance

VI(1)

ISW

VCC

any disabled channel

nYn

nZ

VIL

VI(2)

RS

E

nYn

selected channel(1)

GND

VI

VO

001aag101

(1) Channel is selected by S0 and S1.

VI(1) < GND or VI(1) > VCC.

GND < VI(2) < VCC.

Fig 9. Test circuit for injection current coupling

74HC_HCT4852_3

Product data sheet

Rev. 03 — 2 September 2008

© NXP B.V. 2008. All rights reserved.

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