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74LVQ138T 데이터 시트보기 (PDF) - STMicroelectronics

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74LVQ138T
ST-Microelectronics
STMicroelectronics ST-Microelectronics
74LVQ138T Datasheet PDF : 9 Pages
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74LVQ138
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, RL = 500 , Input tr = tf =3 ns)
Symb ol
Parameter
T est Con ditio n
VCC
(V)
Valu e
TA = 25 oC
-40 to 85 oC
Min. T yp. Max. Min. Max.
Unit
tPLH Propagation Delay Time
tPHL A, B, C to Y
2.7
3.3(*)
7.0 17.0
5.5 12.0
20.0
ns
14.0
tPLH Propagation Delay Time
tPHL G1 to Y
2.7
3.3(*)
7.0 17.0
5.5 12.0
20.0 ns
14.0
tPLH Propagation Delay Time
tPHL G2A or G2B to Y
2.7
3.3(*)
7.0 17.0
5.5 12.0
20.0 ns
14.0
tOSLH Output to Output Skew
tOSHL Time (note 1, 2)
2.7
3.3(*)
0.5 1.5
0.5 1.5
1.5 ns
1.5
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any twooutputs of the same device switching in the
same direction, either HIGH or LOW (tOSLH = |tPLHm - tPLHn|, tOSHL = |tPHLm - tpHLn|)
2) Parameter guaranteed by design
(*) Voltage range is 3.3V ± 0.3V
CAPACITIVE CHARACTERISTICS
Symb ol
Parameter
Test Conditions
VCC
(V)
Valu e
TA = 25 oC
-40 to 85 oC
Min. T yp. Max. Min. Max.
Unit
CIN Input Capacitance
3.3
5
pF
CPD Power Dissipation
3.3
fIN = 10 MHz
50
pF
Capacitance (note 1)
1) CPD isdefined as the value of the IC’sinternal equivalent capacitance which is calculated fromthe operating current consumption without load. (Referto
Test Circuit).Average operting current can be obtained by the following equation. ICC(opr) = CPD VCC fIN + ICC
TEST CIRCUIT
CL = 50 pF or equivalent (includes jigand probe capacitance)
RL = R1 = 500orequivalent
RT = ZOUT of pulse generator (typically 50)
5/9

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