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74LVX04(2004) 데이터 시트보기 (PDF) - STMicroelectronics

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74LVX04
(Rev.:2004)
ST-Microelectronics
STMicroelectronics ST-Microelectronics
74LVX04 Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
74LVX04
Table 8: AC Electrical Characteristics (Input tr = tf = 3ns)
Test Condition
Value
Symbol
Parameter
VCC CL
(V) (pF)
tPLH tPHL Propagation Delay 2.7 15
Time
2.7 50
3.3(*) 15
3.3(*) 50
tOSLH Output To Output
2.7 50
tOSHL
Skew Time (note1,
2)
3.3(*)
50
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
5.4 10.1 1.0 12.5 1.0 14.5
7.9 13.6 1.0 16.0 1.0 18.0
4.1 6.2 1.0 7.5 1.0 8.5 ns
6.6 9.7 1.0 11.0 1.0 12.0
0.5 1.0
1.5
1.5
0.5 1.0
1.5
1.5 ns
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switch-
ing in the same direction, either HIGH or LOW
2) Parameter guaranteed by design
(*) Voltage range is 3.3V ± 0.3V
Table 9: Capacitive Characteristics
Test Condition
Value
Symbol
Parameter
VCC
(V)
CIN Input Capacitance 3.3
CPD Power Dissipation
Capacitance
3.3
(note 1)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
4 10
10
10 pF
18
pF
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/6 (per gate)
Figure 3: Test Circuit
CL =15/50pF or equivalent (includes jig and probe capacitance)
RT = ZOUT of pulse generator (typically 50)
4/11

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